Lecture 1 - Historical Perspective and Future Trends in CMOS VLSI Circuit and System Design - Part I
Lecture 2 - Historical Perspective and Future Trends in CMOS VLSI Circuit and System Design - Part II
Lecture 3 - Logical Effort - A way of Designing Fast CMOS Circuits - Part I
Lecture 4 - Logical Effort - A way of Designing Fast CMOS Circuits - Part II
Lecture 5 - Logical Effort - A way of Designing Fast CMOS Circuits - Part III
Lecture 6 - Power Estimation and Control in CMOS VLSI circuits - Part I
Lecture 7 - Power Estimation and Control in CMOS VLSI circuits - Part II
Lecture 8 - Low Power Design Techniques - Part I
Lecture 9 - Low Power Design Techniques - Part II
Lecture 10 - Arithmetic Implementation Strategies for VLSI - Part I
Lecture 11 - Arithmetic Implementation Strategies for VLSI - Part II
Lecture 12 - Arithmetic Implementation Strategies for VLSI - Part III
Lecture 13 - Arithmetic Implementation Strategies for VLSI - Part IV
Lecture 14 - Interconnect aware design: Impact of scaling, buffer insertion and inductive peaking
Lecture 15 - Interconnect aware design: Low swing and Current mode signaling
Lecture 16 - Interconnect aware design: capacitively coupled interconnects
Lecture 17 - Introduction to Hardware Description Languages
Lecture 18 - Managing concurrency and time in Hardware Description Languages
Lecture 19 - Introduction to VHDL
Lecture 20 - Basic Components in VHDL
Lecture 21 - Structural Description in VHDL
Lecture 22 - Behavioral Description in VHDL
Lecture 23 - Introduction to Verilog
Lecture 24 - FSM + datapath (GCD example)
Lecture 25 - FSM + datapath (Continued...)
Lecture 26 - Single Cycle MMIPS
Lecture 27 - Multicycle MMIPS
Lecture 28 - Multicycle MMIPS FSM
Lecture 29 - Brief Overview of Basic VLSI Design Automation Concepts
Lecture 30 - Netlist and System Partitioning
Lecture 31 - Timing Analysis in the context of Physical Design Automation
Lecture 32 - Placement algorithm
Lecture 33 - Introduction to VLSI Testing
Lecture 34 - VLSI Test Basics - I
Lecture 35 - VLSI Test Basics - II
Lecture 36 - VLSI Testing: Automatic Test Pattern Generation
Lecture 37 - VLSI Testing: Design for Test (DFT)
Lecture 38 - VLSI Testing: Built-In Self-Test (BIST)
Lecture 39 - VLSI Design Verification: An Introduction
Lecture 40 - VLSI Design Verification: An Introduction
Lecture 41 - VLSI Design Verification: Equivalence/Model Checking
Lecture 42 - VLSI Design Verification: Model Checking
