NOC:Scanning Electron-Ion-Probe Microscopy in Materials Characterization

Lecture 1 - Introduction to Microscopy

Lecture 2 - Scanning Electron Microscopy

Lecture 3 - SEM and Its Capabilities

Lecture 4 - Main Components of SEM - Electron Guns

Lecture 5 - Main Components of SEM - Electron Guns and Electromagnetic Lenses

Lecture 6 - Electron Probe Diameter Verses Electron Probe Current

Lecture 7 - Electron Beam - Specimen Interaction

Lecture 8 - Detectors

Lecture 9 - BSE Detector and Sample Preparation for SEM

Lecture 10 - Parameters Need to be Considered to obtain a Good SEM Image

Lecture 11 - How to Get a Good SEM Image

Lecture 12 - Additional Capabilities of SEM

Lecture 13 - Additional Capabilities of SEM (Continued...)

Lecture 14 - Additional Capabilities of SEM (Continued...)

Lecture 15 - Scanning Ion Microscopy - An Introduction

Lecture 16 - Ions Versus Electrons as Source for Microscopy

Lecture 17 - Ions Source in HIM

Lecture 18 - GFIS Properties and Ion Optical Column

Lecture 19 - Ion Optical Column

Lecture 20 - Ion-Solid Interactions and Signal Generation

Lecture 21 - Signal Generation and Contrast Mechanism

Lecture 22 - Contrast Mechanism and Imaging Modes

Lecture 23 - Scanning Transmission Ion Microscopy and Microanalysis with HIM

Lecture 24 - Creation and Modification of Materials by HIM

Lecture 25 - Introduction to Scanning Probe Microscopy

Lecture 26 - STM Instrumentation

Lecture 27 - Main Components of STM

Lecture 28 - Main Components of STM (Continued...)

Lecture 29 - Main Components of STM (Continued...)

Lecture 30 - Working Principle of STM

Lecture 31 - Operating Modes

Lecture 32 - Scanning Tunneling Spectroscopy

Lecture 33 - SPM - Atomic Force Microscopy (AFM)

Lecture 34 - Force Between Tip and Sample in AFM

Lecture 35 - Atomic Force Microscope - Parts

Lecture 36 - Modes of AFM Operation

Lecture 37 - Modes of AFM Operation (Continued...)

Lecture 38 - AFM Imaging

Lecture 39 - Phase Imaging, Noises and Resolution

Lecture 40 - Surface Properties Measurements using Other Forces

Lecture 41 - Surface Properties Measurements using AFM

Lecture 42 - Manipulation of Atoms, Molecules and Industrial Applications

Lecture 43 - Summary